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 OLED/LCD/LCOS/CCD/CIS
Array, Wafer Test System |
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 About this product [
 Contact] |
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The latest Full Spec Test System for OLED, LCD, LCOS, CCD, CMOS Image
Sensor (CIS).
We strengthened the function vastly, such as testing frequency, parallel
testing function,
pixcel data acquisition and so on, to meet the testing requirement for the
device trend in the future. |
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| Device to test |
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OLED, LCD, LCOS, CCD, CIS, LCD VGA - UXGA
( Full pins or Block Probing ) |
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| Measurement Form |
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CDS, DCS Available: Digital Integration |
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| Treatment Form |
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By the Image Processing. 4 times faster than ever |
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| Drive Pattern and Frequency |
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DC to 80MHz |
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| Drive Voltage |
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-10.24v - +20.47v |
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| Acquisition |
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Max 8ch(covers 16 devices in max), 380M pixel data/ch |
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| DC Parametric Test |
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Pin Continuity Test, Shift Resister Test,
Per Pin Voltage Margin Test, Leakage Test, etc. |
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