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 OLED/LCD/LCOS/CCD/CIS
Array, Wafer Test System |
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 About this product [  Contact] |
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Conpact and Low Cost Test System For OLED, LCD, LCOS, CCD, and CMOS Image
Sensor
System Spec able to select from main test items as DC Test or Function Test |
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| Device to test |
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OLED, LCD, LCOSCCD, CIS, LCD VGA~UXGA
(Full pins
or Block Probing ) |
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| Measurement Form |
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CDS, DCS Available: Digital Integration |
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| Treatment Form |
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By the Image Processing |
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| Drive Pattern and Frequency |
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DC-40MHz 100ps Resolution, 32-128ch |
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| Drive Voltage |
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40vp-p Max 128ch |
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| Acquisition |
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40MHz 10bit Max 8M Buffer Memory |
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| DC Parametric Test |
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Pin Continuty Test, Shift Resister Test, Voltage
Margin Test, Leakage Test, etc. |
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